Semiconductor device and method of manufacturing same
AssigneeRenesas Electronics Corporation
InventorsKatsumi Eikyu, Atsushi Sakai, Hiroyuki Arie
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AssigneeRenesas Electronics Corporation
InventorsKatsumi Eikyu, Atsushi Sakai, Hiroyuki Arie
Estimating the term…
To provide a semiconductor device having a photoelectric conversion element having a high sensitivity, causing less blooming, and capable of providing a highly reliable image. The semiconductor device has a semiconductor substrate, a first p type epitaxial layer, a second p type epitaxial layer, and a first photoelectric conversion element. The first p type epitaxial layer is formed over the main surface of the semiconductor substrate. The second p type epitaxial layer is formed so as to cover the upper surface of the first p type epitaxial layer. The first photoelectric conversion element is formed in the second p type epitaxial layer. The first and second p type epitaxial layers are each made of silicon and the first p type epitaxial layer has a p type impurity concentration higher than that of the second p type epitaxial layer.
A semiconductor device, comprising:
A semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.