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US 9,437,316 B2Granted
Continuous adjusting of sensing voltages
AssigneeMicron Technology, Inc.
InventorLarry J. Koudele
Life of this patent
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Abstract
The present disclosure includes apparatuses and methods for continuous adjusting of sensing voltages. A number of embodiments include continuously monitoring an error rate associated with sense operations performed on a group of memory cells, and continuously adjusting a sensing voltage used to determine a state of the memory cells of the group based, at least partially, on the error rate.
Claims17
A method for operating memory, comprising:
- monitoring a current error rate associated with a number of sense operations currently performed on a group of memory cells;
- comparing the current error rate with a previous error rate associated with a number of sense operations previously performed on the memory cells of the group, wherein comparing the current error rate with the previous error rate includes determining a difference between the current error rate and the previous error rate;
- and
- adjusting a sensing voltage used to determine a state of the memory cells of the group based, at least partially, on whether the difference between the current error rate and the previous error rate is greater than a threshold deviation.
1 more element
An apparatus, comprising:
- a memory comprising a number of groups of memory cells;
- and
- a controller coupled to the memory and configured to:
- continuously monitor an error rate associated with sense operations performed on the memory cells of each of the number of groups by continuously performing an accumulation loop that monitors the error rate associated with each sense operation performed on the memory cells of each respective group during operation of the memory;
- and
- continuously adjust a sensing voltage used to determine a state of the memory cells of each respective group based, at least partially, on the error rate associated with the sense operations performed on the memory cells of that respective group.
3 more elements
A method for operating memory, comprising:
- continuously, during operation of the memory, monitoring an error rate associated with sense operations performed on a group of memory cells;
- and
- continuously, during the operation of the memory, adjusting a sensing voltage used to determine a state of the memory cells of the group based, at least partially, on the error rate by continuously performing a correction loop during the operation of the memory.
Dependencies are inferred from the claim text.