Nonvolatile semiconductor memory device
AssigneeKabushiki Kaisha Toshiba
InventorsKiyotaro Itagaki, Masaru Kito, Ryu Ogiwara, Hitoshi Iwai
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AssigneeKabushiki Kaisha Toshiba
InventorsKiyotaro Itagaki, Masaru Kito, Ryu Ogiwara, Hitoshi Iwai
Estimating the term…
A control circuit is configured to execute an erasing operation on a selected cell unit in a selected memory block. In the erasing operation, the control circuit raises the voltage of the bodies of the first memory transistors included in the selected cell unit to a first voltage, sets the voltage of the bodies of the first memory transistors included in the non-selected cell unit to a second voltage lower than the first voltage, and applies a third voltage equal to or lower than the second voltage to the gates of the first memory transistors included in the selected cell unit and the non-selected cell unit.
A nonvolatile semiconductor memory device comprising:
Dependencies are inferred from the claim text.