Live data center test framework
AssigneeAmazon Technologies, Inc.
InventorsAnirudh Balachandra Aithal, Michael David Marr
Life of this patent
Estimating the term…
Abstract
Systems and methods are described for testing computing resources. In one embodiment, a search space of computing settings is analyzed in accordance with weighted data that maps computing performance parameters with the computing settings. A subset of the computing settings is selected to generate a test population to optimize at least one computing performance parameter. One or more computing devices in a computing environment are configured in accordance with the test population, and the test conditions are iteratively updated based on test results in accordance with the test population and a fitness function.
Claims9
One or more non-transitory computer-readable storage media having collectively stored thereon executable instructions that, when executed by one or more processors of a computer system, cause the computer system to:
- select a test population based on one or more performance metrics;
- and
- cause execution of tests in accordance with the test population and bias the test population to iteratively update the test population based on results of the tests, wherein the tests are executed on computing devices selected from a computing environment based on availability criteria in accordance with a computing configuration management function, wherein the computing configuration management function is configured to determine a cost for removal of the selected computing devices from the computing environment during the execution of the tests, wherein the tests are executed when the cost for removal of the selected computing devices is less than a threshold.
A computer-implemented method for computing device testing comprising:
- selecting a test population based on one or more performance metrics;
- and
- causing execution of tests in accordance with the test population and bias the test population to iteratively update the test population based on results of the tests, wherein the tests are executed on computing devices selected from a computing environment based on availability criteria in accordance with a computing configuration management function, wherein the computing configuration management function is configured to determine a cost for removal of the selected computing devices from the computing environment during the execution of the tests, wherein the tests are executed when the cost for removal of the selected computing devices is less than a threshold.
A computing system for computing device testing comprising:
- at least one computing processor;
- and
- at least one memory in communication with the at least one processor, the at least one memory having stored therein computer instructions that, upon execution by the at least one processor, cause at least cause the computing system to:
- select a test population based on one or more performance metrics;
- and
- cause execution of tests in accordance with the test population and bias the test population to iteratively update the test population based on results of the tests, wherein the tests are executed on computing devices selected from a computing environment based on availability criteria in accordance with a computing configuration management function, wherein the computing configuration management function is configured to determine a cost for removal of the selected computing devices from the computing environment during the execution of the tests, wherein the tests are executed when the cost for removal of the selected computing devices is less than a threshold.
Dependencies are inferred from the claim text.