Memory bit MBIST architecture for parallel master and slave execution

A method of conducting memory built-in self-test (MBIST) testing in a semiconductor device comprising:

• sending address and test data to a plurality of Memory Built-In Self-Test Data Path interfaces (MBISTDP I/Fs) from a master controller, wherein the MBISTDP I/Fs and the master controller are connected in a ring;
• forwarding the address and test data to at least a first slave controller and a second slave controller from at least one of the MBISTDP I/Fs;
• conducting a first MBIST test on a first memory array attached to the first slave controller;
• conducting a second MBIST test on a second memory array attached to the second slave controller;
• returning first test result data from the first slave controller to a first MBISTDP I/F in the ring;
• returning second test result data from the second slave controller to a second MBISTDP I/F in the ring;
• forwarding the first test result data from the first MBISTDP I/F to the second MBISTDP I/F;
• concatenating, at the second MBISTDP I/F, the first test result data and the second test result data to generate concatenated test result data;
• and
• forwarding the concatenated test result data to a third MBISTDP I/F in the ring.

A non-transitory computer-readable storage device encoded with data that, when implemented in a manufacturing facility, adapts the manufacturing facility to create an apparatus that, when operated, performs a process comprising:

• sending address and test data to a plurality of Memory Built-In Self-Test Data Path interfaces (MBISTDP I/Fs) from a master controller, wherein the MBISTDP I/Fs and the master controller are connected in a ring;
• forwarding the address and test data to at least a first slave controller and a second slave controller from at least one of the MBISTDP I/Fs;
• conducting a first MBIST test on a first memory array attached to the first slave controller;
• conducting a second MBIST test on a second memory array attached to the second slave controller;
• returning first test result data from the first slave controller to a first MBISTDP IF in the ring;
• returning second test result data from the second slave controller to a second MBISTDP I/F in the ring;
• forwarding the first test result data from the first MBISTDP I/F to the second MBIST DP I/F;
• concatenating, at the second MBISTDP I/F, the first test result data and the second test result data to generate concatenated test result data;
• and
• forwarding the concatenated test result data to a third MBISTDP I/F in the ring.