Chemically-amplified negative resist composition and resist patterning process using the same
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsDaisuke Domon, Keiichi Masunaga, Satoshi Watanabe
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AssigneeShin-Etsu Chemical Co., Ltd.
InventorsDaisuke Domon, Keiichi Masunaga, Satoshi Watanabe
Estimating the term…
The present invention provides a chemically-amplified negative resist composition including a sulfonium salt capable of providing a pattern having an extremely high resolution with reduced line edge roughness, and also provides a resist patterning process using the same. The present invention was accomplished by a chemically-amplified negative resist composition including (A) a salt represented by the following general formula (1) and (B) a resin containing one or more kinds of repeating unit represented by the following general formulae (UN-1) and (UN-2) and a resist patterning process using the same.
A chemically-amplified negative resist composition for high energy beam exposure comprising:
Dependencies are inferred from the claim text.