Radiation detector based on charged self-assembled monolayers on nanowire devices
AssigneeGlobalfoundries Inc.
InventorsAli Afzali-Ardakani, Jose M. Lobez Comeras
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Abstract
Radiation detectors having nanowires with charged, radiation-labile coatings configured to change the electrical properties of nanowires are provided. In one aspect, a radiation detection device is provided. The radiation detector device includes at least one nanowire having a radiation-labile coating with charged moieties on a surface thereof, wherein the radiation-labile coating is configured to degrade upon exposure to radiation such that the charged moieties are cleaved from the radiation-labile coating upon exposure to radiation and thereby affect a transconductance of the nanowire.
Claims20
A radiation detection device, comprising:
- at least one nanowire having a radiation-labile coating on a surface thereof, wherein the radiation-labile coating comprises a monolayer of charged molecules having charged moieties tethered to the charged molecules and extending out from the surface of the nanowire, and wherein the radiation-labile coating is configured to degrade upon exposure to radiation such that the charged moieties are irreversibly cleaved from the radiation-labile coating upon exposure to radiation and thereby affect a transconductance of the nanowire.
A radiation detection device, comprising:
- at least one transistor comprising:
- a back gate formed in a wafer;
- at least one nanowire on the wafer over the back gate, the nanowire having a radiation-labile coating on a surface thereof, wherein the radiation-labile coating comprises a monolayer of charged molecules having charged moieties tethered to the charged molecules and extending out from the surface of the nanowire, and wherein the radiation-labile coating is configured to degrade upon exposure to radiation such that the charged moieties are irreversibly cleaved from the radiation-labile coating upon exposure to radiation and thereby affect a transconductance of the nanowire;
- and
- source and drain electrodes in contact with opposite ends of the nanowire.
A method of forming a radiation detection device, the method comprising the steps of:
- forming a back gate in a wafer;
- depositing at least one nanowire on the wafer over the back gate;
- forming source and drain electrodes in contact with opposite ends of the nanowire;
- and
- covering a surface of the nanowire with a radiation-labile coating having charged moieties, wherein the radiation-labile coating comprises a monolayer of charged molecules having charged moieties tethered to the charged molecules and extending out from the surface of the nanowire, and wherein the radiation-labile coating is configured to degrade upon exposure to radiation such that the charged moieties are irreversibly cleaved from the radiation-labile coating upon exposure to radiation and thereby affect a transconductance of the nanowire.
A method for radiation detection, the method comprising the steps of:
- obtaining a transconductance output signal from a radiation detection device at time t, wherein the radiation detection device comprises at least one nanowire having a radiation-labile coating on a surface thereof, wherein the radiation-labile coating comprises a monolayer of charged molecules having charged moieties tethered to the charged molecules and extending out from the surface of the nanowire, and wherein the radiation-labile coating is configured to degrade upon exposure to radiation such that the charged moieties are irreversibly cleaved from the radiation-labile coating upon exposure to radiation and thereby affect a transconductance of the nanowire;
- comparing the transconductance output signal obtained from the radiation detection device at time t to an initial transconductance output signal of the radiation detection device;
- determining whether the transconductance output signal obtained from the radiation detection device at time t is the same as the initial transconductance output signal of the radiation detection device;
- and
- determining that the radiation detection device has not been exposed to radiation if the transconductance output signal obtained from the radiation detection device at time t is the same as the initial transconductance output signal of the radiation detection device, otherwise determining that the device has been exposed to radiation.
Dependencies are inferred from the claim text.