Integrated circuit testing interface on automatic test equipment

An automatic test equipment (ATE) for testing a semiconductor device, comprising:

• a tester;
• a prober, configured for carrying the semiconductor device;
• a probe card, coupled to the tester for probing the semiconductor device;
• and
• an integrated circuit (IC) testing interface, coupled to the tester and installed outside of the tester, the IC testing interface comprising:
• at least one pin, configured for receiving or transmitting at least one test signal to the tester;
• a plurality of digitizers, coupled to the at least one pin for generating a digital signal;
• a processing means, coupled to the plurality of digitizers for processing the digital signal;
• and
• a connection unit, configured for connecting the processing means with a computing device for transmitting an output signal from the processing means to the computing device;
• wherein the IC testing interface is disposed between the tester and the prober of the ATE;
• wherein the at least one pin comprises:
• a first pin, configured for transmitting a first test signal of the at least one test signal to the tester of the ATE, wherein the first test signal comprises an enabling signal for reading or writing a testing datum;
• a second pin, configured for transmitting a second test signal of the at least one test signal to the tester of the ATE, wherein the second test signal comprises a sampling signal for determining a sampling number of the semiconductor device;
• and
• a third pin, configured for transmitting a third test signal of the at least one test signal to the tester of the ATE, wherein the third test signal comprises a testing result.