Socket device for an IC test
AssigneeHicon Co., Ltd.
InventorDong Weon Hwang
Life of this patent
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AssigneeHicon Co., Ltd.
InventorDong Weon Hwang
Estimating the term…
Disclosed herein is a socket device for an integrated circuit (IC) test. The device includes: a socket which is provided with a pin guide plate that can guide and protect a spring contact so as to prevent damage to or breakage of the spring contact that electrically connects an IC lead to a PCB; and an IC insert provided with a guide plate. According to said configuration, ball grid array (BGA) ICs in which IC leads are balls can be more efficiently tested. Particularly, contact pins of the socket and the IC leads can be mechanically and electrically more precisely positioned for narrow pitches of the IC leads such as 0.4 mm, 0.35 mm, and 0.3 mm. Thereby, damage to or breakage not only of the ICs to be tested but also of the socket can be minimized.
A socket device for IC tests, the socket device comprising:
Dependencies are inferred from the claim text.