Apparatus and method for power cycle test

A power cycle test apparatus for performing a power cycle test for a power semiconductor device to be tested by applying a thermal stress to the power semiconductor device to be tested through the application of a stress current thereto in predefined ON/OFF cycles,

• the apparatus comprising:
• a current source for applying the current to the power semiconductor device to be tested;
• a temperature changing device for changing a temperature in an external environment of the power semiconductor device to be tested;
• and
• a controller for controlling the power cycle test apparatus, wherein
• the controller executes a thermal cycle test in temperature rise-fall cycles longer than the ON/OFF cycles by using the temperature changing device, and
• the controller further executes the power cycle test in synchronization with execution phases of the thermal cycle test while executing the thermal cycle test.