Circuit and method for detection of IC connection failure

A method of testing a connection between an RF chip and external circuitry, comprising:

• injecting a DC current towards the connection to be tested;
• providing a path between one side of the connection to be tested and a fixed voltage line through an on-chip ESD protection circuit;
• providing a shunt path coupled to the other side of the connection to be tested;
• and determining if the current source current flows through the ESD protection circuit and thereby determine whether the connection to be tested presents a short circuit for DC, wherein the ESD protection circuit is between one side of the connection to be tested and a constant voltage line, and the shunt path is between the other side of the connection to be tested and a second connection, wherein the current source output is coupled to the second connection.

A testing circuit for testing a plurality of IC connections between an RF chip and external circuitry, the testing circuit comprising:

• a first connection and a second connection on an RF chip;
• a current source for injecting a DC current through the second connection and towards the first connection;
• an on-chip ESD protection circuit which provides a path between one side of the connections and a fixed voltage line;
• a shunt path coupled to the other side of the connections;
• and
• a testing unit, wherein the testing unit is adapted to determine if the current source current flows out of the RF chip through the second connection and returns into the RF chip through the first connection.