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US 9,435,786 B2Granted
Method for determining differentiation level of pluripotent stem cells
AssigneeHamamatsu Photonics K.K.
InventorsToyohiko Yamauchi, Norikazu Sugiyama, Tadashi Fukami, Hidenao Iwai
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Abstract
The present invention provides a method for determining differentiation level of pluripotent stem cell, comprising a step of determining a flatness of cultured pluripotent stem cell, wherein the flatness is an indication.
Claims16
A method comprising the steps of:
- i) measuring flatness of at least one cultured pluripotent stem cell to determine whether the cultured pluripotent stem cell or a cultured pluripotent stem cell population is differentiated by applying a Student's t-test to compare the flatness of the cultured pluripotent stem cell or the cultured pluripotent stem cell population with those of undifferentiated pluripotent stem cells and differentiated cells, and
- ii) identifying and removing at least one cultured pluripotent stem cell that is determined to be differentiated,
- wherein the flatness of the cultured pluripotent stem cell or the cultured pluripotent stem cell population is measured from at least one tomographic image of a three-dimensional image of the cultured pluripotent stem cell or the cultured pluripotent stem cell population,
- wherein the measured flatness is flatness of a surface of the cultured pluripotent stem cell roughly parallel to a bottom surface of the cultured pluripotent stem cell attached to a culture vessel or flatness of a surface of the cultured pluripotent stem cell population roughly parallel to a bottom surface of the cultured pluripotent stem cell population attached to a culture vessel, and
- wherein the measured flatness of a differentiated cell or a differentiated cell population is statistically different from the measured flatness of an undifferentiated pluripotent stem cell or an undifferentiated pluripotent stem cell population.
2 more elements
Dependencies are inferred from the claim text.