Reflectance spectroscopy measuring and sampling system and method for gemstone testing
AssigneeBiaoqi Electronics Technology Co., Ltd.
InventorsGuangjun Song, Xiangli Zheng, Jianfeng Wu, Ling Gao
Life of this patent
Estimating the term…
Loading patent…
AssigneeBiaoqi Electronics Technology Co., Ltd.
InventorsGuangjun Song, Xiangli Zheng, Jianfeng Wu, Ling Gao
Estimating the term…
A reflectance spectroscopy measuring and sampling system for gemstone testing is disclosed. The system includes a first light source (1), a second light source (2), a light filtering element, an integrating sphere (S), an optical fiber (9), a spectroscopic detection module (10), an analog-digital conversion module (11) and a data processing terminal (12), wherein the integrating sphere (S) is provided with an entrance port, a sampling opening (6) and a reflected light exit port (7). A reflectance spectroscopy measuring and sampling method for gemstone testing is also disclosed. The system and the method have an excellent performance and can be widely used in the gemstone identification.
A reflectance spectroscopy measuring and sampling system for a gemstone sample, comprising:
A reflectance spectroscopy measuring and sampling system for a sample, comprising:
Dependencies are inferred from the claim text.