Processing materials

An apparatus for irradiating a material, the apparatus comprising:

• an electron beam irradiation device and a vibratory conveying system;
• wherein the vibratory conveying system comprises a cooled vibratory conveyor trough configured to convey a biomass material under the electron beam irradiation device, and
• wherein the vibratory conveyor trough comprises a first surface configured to support and convey a biomass material, and a second surface that is in thermal communication with the first surface and is configured to contact a cooling system.

A method of conveying a material, the method comprising:

• conveying a material through a field of accelerated electrons, the electrons impinging upon a treatment zone of a vibratory conveyor, wherein the treatment zone includes a beam dump in thermal communication with the treatment zone.

A method of conveying a material, the method comprising:

• conveying a material through a field of accelerated electrons, the electrons impinging upon the treatment zone of a vibratory conveyor, wherein the treatment zone includes both a beam dump in thermal communication with the treatment zone and a cooling enclosure in thermal communication with the treatment zone.

An apparatus for irradiating a material, the apparatus comprising:

• an electron beam irradiation device and a conveying system;
• wherein the conveying system comprises a cooled conveyor trough configured to convey a biomass material under the electron beam irradiation device and
• wherein the conveyor trough comprises a first surface configured to support and convey a biomass material, and a second surface that is in thermal communication with the first surface and is configured to contact a cooling system.

A method of conveying a material under an electron beam, the method comprising:

• exposing a biomass material to an electron beam having a scan horn, while conveying the biomass material on a vibratory conveyor that is oscillated in a direction parallel to the direction of conveying and perpendicular to the scan horn of the electron beam.