Systems and methods for calibrating a dual port phase locked loop

A semiconductor device comprising:

• a phase-locked loop (PLL) comprising:
• a high-port calibration control module configured to
• calibrate an input modulation value of a voltage-controlled oscillator (VCO) to a first modulation value that results in an output signal of the VCO having a positive frequency change from an initial output frequency,
• capture positive frequency value of the output signal after a first accumulation time period,
• calibrate the input modulation value of the VCO to a second modulation value that results in the output signal having a negative frequency change from the initial output frequency,
• capture a negative frequency value of the output signal after a second accumulation time period, and
• calculate a calibration scale factor based on a difference between the positive and negative frequency values, including
• calculate a change in modulation value equal to a difference between the first and second modulation values;
• calculate a change in output frequency equal to a difference between the positive and negative frequency values;
• calculate calibration resolution equal to the change in output frequency divided by the change in modulation value;
• and
• calculate the calibration scale factor equal to a low-port modulation resolution divided by the calibration resolution,
• wherein the low-port modulation resolution is equal to a reference frequency divided by base 2 raised to a number of modulation steps available in a low-port modulator.

A method for operating a phase-locked loop (PLL) comprising:

• calibrating an input modulation value of a voltage-controlled oscillator (VCO) of the PLL to a first modulation value that results in an output signal of the VCO having a positive frequency change from an initial output frequency,
• capturing a positive frequency value of the output signal after a first accumulation time period,
• calibrating the input modulation value of the VCO to a second modulation value that results in the output signal having a negative frequency change from the initial output frequency,
• capturing a negative frequency value of the output signal after a second accumulation time period, and
• calculating a calibration scale factor based on a difference between the positive and negative frequency values, including:
• calculating a change in modulation value equal to a difference between the first and second modulation values;
• calculating a change in output frequency equal to a difference between the positive and negative frequency values;
• calculating calibration resolution equal to the change in output frequency divided by the change in modulation value;
• and
• calculating the calibration scale factor equal to a low-port modulation resolution divided by the calibration resolution,
• wherein the low-port modulation resolution is equal to a reference frequency divided by base 2 raised to a number of modulation steps available in a low-port modulator.