Probe
AssigneeElcometer Limited
InventorsColin John Morley, John Michael Whitaker, Michael Carrington Sellars
Life of this patent
Estimating the term…
Abstract
A surface profile measurement probe comprising two spaced apart points 20 for contacting a convex surface to be measured and a straight edge or surface 22 moveable relative to the two points to enable the straight edge to be brought into contact with a convex surface contacted by the two points. A tip 10 protrudes from and is moveably mounted relative to the straight edge or surface for measuring the profile of a surface contacted by the straight edge.
Claims19
A surface roughness measurement probe comprising two spaced apart points for contacting a convex surface to be measured, at least a straight edge moveable relative to the two points to enable the straight edge to be brought into contact with a convex surface contacted by the two points and a tip protruding from and moveably mounted relative to the straight edge for measuring the surface roughness of a surface contacted by the straight edge.
A surface profile measurement probe comprising two spaced apart points for contacting a convex surface to be measured, at least a straight edge moveable relative to the two points to enable the straight edge to be brought into contact with a convex surface contacted by the two points and a tip protruding from and moveably mounted relative to the straight edge for measuring the profile of a surface contacted by the straight edge, wherein the straight edge is formed on a probe body, and the points are provided on a structure at opposite sides respectively of the body, and wherein the structure on which the points are disposed is a collar surrounding the probe body.
Dependencies are inferred from the claim text.