Deep trench structure for high density capacitor
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsAlex Kalnitsky, Felix Ying-Kit Tsui, Hsin-Li Cheng, Jing-Hwang Yang, Jyun-Ying Lin
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsAlex Kalnitsky, Felix Ying-Kit Tsui, Hsin-Li Cheng, Jing-Hwang Yang, Jyun-Ying Lin
Estimating the term…
Some embodiments relate to high density capacitor structures. Some embodiments include a semiconductor substrate having an conductive region with a plurality of trenches formed therein. A first dielectric layer is formed over respective bottom portions and respective sidewall portions of the respective trenches. A first conductive layer is formed in the trench and over the first dielectric layer, wherein the first dielectric layer acts as a first capacitor dielectric between the conductive region and the first conductive layer. A second dielectric layer is formed in the trench and over the first conductive layer. A second conductive layer is formed in the trench and over the second dielectric layer, wherein the second dielectric layer acts as a second capacitor dielectric between the first conductive layer and the second conductive layer. Other embodiments are also disclosed.
An integrated circuit (IC), comprising:
An integrated circuit (IC), comprising:
Dependencies are inferred from the claim text.