System for separating devices from a semiconductor wafer

A method of separating semiconductor devices of a semiconductor wafer including back metal on the backside thereof positioned on a planar plastic film, said method comprising the steps of:

• removing the semiconductor material in scribe streets between said semiconductor devices until the back metal is exposed in said scribe streets;
• after removing the semiconductor material from the scribe streets, supporting the plastic film on a support structure having a support surface spaced from and surrounding the semiconductor wafer;
• with the planar plastic film supported on the support surface spaced from and surrounding the semiconductor wafer, at said support structure applying a variable radial force to said planar plastic film spaced from and extending completely about the periphery of said semiconductor wafer to radially stretch and tension the planar plastic film in all radial directions in the plane of the planar plastic film;
• controlling the radial stretch and tension of the planar plastic film as a function of a control parameter;
• while maintaining control of the radial stretch and tension of the planar plastic film pressing a stylus against the semiconductor wafer while in engagement with the radially stretched and tensioned planar plastic film to cause the plastic film to further deform and stretch in the immediate region where the stylus presses, causing the back metal in the scribe streets located in said region to separate;
• and
• moving the stylus across the semiconductor wafer and engaging the radially stretched and tensioned planar plastic film to further deform and stretch different regions of the plastic film and while pressing the stylus against the semiconductor wafer causing the back metal in the scribe streets in said different regions to break and separate.