Batch control using bang-bang control
AssigneeFrito-Lay North America, Inc.
InventorsWilfred Marcellien Bourg, Jr., Dale M. Smith
Life of this patent
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Abstract
A method for batch control in a system. The system comprises at least two batch processing sets that share at least one shared equipment. A batch is initiated in each processing set. Process variables from each batch are monitored. At least one process variable from at least one batch are adjusted using bang-bang control to prevent conflicts.
Claims29
A batch control method for producing chips utilizing bang-bang control to avoid a conflict over a first piece of shared equipment in a system, wherein said first piece of shared equipment is used by at least two batch processes for making chips, wherein said bang-bang control comprises adjusting at least one process variable between at least two states to provide at least one adjusted process variable and to obtain a desired process condition, wherein said adjusting prevents a conflict in said system, said conflict arising when at least two batch processes simultaneously require a first piece of shared equipment, said system comprising:
- a first batch processing set comprising a first kettle and said first piece of shared equipment;
- a second batch processing set comprising a second kettle and said first piece of shared equipment;
- and
- a controller;
- said method comprising:
- a. starting a first batch process for producing chips in said first batch processing set, introducing a first material for said first batch process in said first batch processing set, and cooking said first material in said first kettle to produce chips;
- b. starting a second batch process for producing chips in said second batch processing set, introducing a second material for said second batch process in said second batch processing set, and cooking said second material in said second kettle to produce chips;
- c. utilizing said controller in monitoring at least one process condition on said first batch process to provide a first set of monitored process conditions and utilizing said controller in monitoring at least one process condition on said second batch process to provide a second set of monitored process conditions;
- d. utilizing said controller in adjusting said at least one process variable to provide said at least one adjusted process variable and to obtain said desired process condition, thereby preventing said conflict;
- wherein said first piece of shared equipment is selected from the group consisting of a pump, an agitator, a conveyor, a slicer, and a heat exchanger;
- wherein said first set of monitored process conditions comprises a process condition selected from the group consisting of a temperature, a time, a rate of heating, a rate of cooling, a fluid flow rate, a duty of a burner, a duty of a heat exchanger, a percent conversion, and an intermediate chip property;
- wherein said second set of monitored process conditions comprises a process condition selected from the group consisting of a temperature, a time, a rate of heating, a rate of cooling, a fluid flow rate, a duty of a burner, a duty of a heat exchanger, a percent conversion, and an intermediate chip property;
- wherein said at least one adjusted process variable comprises a process variable on a batch process selected from the group consisting of said first batch process and said second batch process;
- wherein said at least one adjusted process variable comprises a process variable selected from the group consisting of a rate of heating, a rate of cooling, a fluid flow rate, a duty of a burner, a duty of a heat exchanger, and a temperature;
- and
- wherein said desired process condition selected from the group consisting of a desired temperature, a desired separation time, a desired batch processing time, a desired total batch time, a desired batch finish time, a desired rate of heating, a desired rate of cooling, a desired duty of a burner, a desired duty of a heat exchanger, a desired percent conversion, a desired intermediate chip property, and a desired final chip property.
Dependencies are inferred from the claim text.