US 9,040,932 B2 · Surface contamination monitoring system and method

Abstract

A surface contamination monitoring system/method configured to correct the detected the radioactive net count rate (NCR) value of a whole-body surface contamination monitoring device based on monitored subject height and thickness is disclosed. The system includes a height detection means for determining the height of a monitored subject and a thickness detection means for determining the thickness of at least a portion of the monitored subject. The net count rate (NCR) is corrected based on the determined height and thickness of the monitored subject as applied to site calibration factor data and self-shielding factor data to produce a corrected net count rate (CNR). If the corrected net count rate (CNR) registers above a preset alarm threshold, the monitored subject is considered contaminated and an appropriate alarm is registered.

Claims25

Dependent claims

A surface contamination monitoring system comprising:

(a) radiation detector array;
and
(b) computing device;
wherein
said radiation detector array is configured to monitor radioisotope surface-contamination of a monitored subject;
said computing device is configured to compute a corrected net count rate (CNR) based upon the net count rate (NCR) output of said radiation detector array;
said CNR comprises a self-shielding correction factor;
said self-shielding correction factor comprises a height value and a thickness value;
said height value represents a physical characteristic of said monitored subject;
and
said thickness value represents a physical characteristic of said monitored subject.

8 more elements

Dependencies are inferred from the claim text.

Surface contamination monitoring system and method

Life of this patent

Surface contamination monitoring system and method

Life of this patent

Abstract

Claims25