Method and apparatus for tuning an electrostatic ion trap
AssigneeMKS Instruments, Inc.
InventorsGerardo A. Brucker, G. Jeffery Rathbone, Brian J. Horvath, Timothy C. Swinney, Stephen C. Blouch, Jeffrey G. McCarthy, Timothy R. Piwonka-Corle
Life of this patent
Estimating the term…
Abstract
An apparatus includes an electrostatic ion trap and electronics configured to measure parameters of the ion trap and configured to adjust ion trap settings based on the measured parameters. A method of tuning the electrostatic ion trap includes, under automatic electronic control, measuring parameters of the ion trap and adjusting ion trap settings based on the measured parameters.
Claims40
A method of tuning an electrostatic ion trap, the method comprising, under automatic electronic control:
- i) measuring parameters of the ion trap, the trap including an ion source having an electron source;
- ii) adjusting ion trap settings based on the measured parameters;
- and
- iii) employing the ion trap settings and producing test spectra from a test gas at a specified pressure.
An apparatus comprising:
- i) an electrostatic ion trap, the trap including an ion source having an electron source;
- and
- ii) electronics configured to measure parameters of the ion trap and configured to adjust ion trap settings based on the measured parameters and configured to employ the ion trap settings to produce test spectra from a test gas at a specified pressure.
Dependencies are inferred from the claim text.