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AssigneeABB Research Ltd.
InventorsVinoth Sundaramoorthy, Alexander Heinemann, Enea Bianda, Franz Zurfluh, Gerold Knapp, Iulian Nistor, Richard Bloch
Estimating the term…
A system and method are provided for monitoring in real time the operating state of an IGBT device, to determine a junction temperature and/or the remaining lifetime of an IGBT device. The system includes a differential unit configured to receive a gate-emitter voltage characteristic of the IGBT device to be measured and to differentiate the gate-emitter voltage characteristic to obtain pulses correlating with edges formed by a Miller plateau phase during a switch-off phase of the IGBT device. The system also includes a timer unit configured to measure the time delay between the obtained pulses indicating the start and end of the Miller plateau phase during the switch-off phase of the IGBT device, and a junction temperature calculation unit configured to determine at least one of the junction temperature of the IGBT device and/or the remaining lifetime of the IGBT device based on the measured time delay.
A system for determining at least one of a junction temperature and a remaining lifetime of an IGBT device, comprising:
A method for determining at least one of a junction temperature and a remaining lifetime of an IGBT device, the method comprising:
Dependencies are inferred from the claim text.