Surface plasmon resonance fluorescence analysis device and surface plasmon resonance fluorescence analysis method

A surface plasmon resonance fluorescence analysis device for measuring fluorescence emitted by excitation of a fluorescent material labeled on a specimen by an electric field based on surface plasmon resonance, the surface plasmon resonance fluorescence analysis device comprising:

• a prism having a metal film formed on a predetermined surface thereof;
• a light source portion which emits excitation light for causing surface plasmon resonance on the metal film;
• and
• an incident path adjusting portion which allows the excitation light to enter the prism by reflection of the excitation light emitted from the light source portion, wherein
• the incident path adjusting portion includes a reflective member having a reflective surface formed thereon for reflecting the excitation light from the light source portion, and a driving portion for driving the reflective member, and
• the driving portion is configured to change a position of the reflective member and to adjust an orientation of the reflective surface in such a manner that the excitation light entered the prism is reflected at a specific position on the metal film.

A surface plasmon resonance fluorescence analysis method for measuring light emitted by excitation of a fluorescent material labeled on a specimen by an electric field based on surface plasmon resonance, the surface plasmon resonance fluorescence analysis method comprising:

• a preparation step of preparing a prism having a metal film formed on a predetermined surface thereof, and of allowing a sample solution containing the specimen to flow on the metal film;
• an excitation light emission step of emitting excitation light for causing surface plasmon resonance on the metal film;
• a resonance angle scanning step of changing an incident angle of the excitation light with respect to the metal film while maintaining a state in which the excitation light that is reflected on a reflective surface of the reflective member and enters the prism is reflected at a specific position on the metal film, by changing a position of the reflective member having the reflective surface formed thereon for reflecting the excitation light, and by adjusting an orientation of the reflective surface, and of measuring an intensity of light to be generated on a side of the metal film opposite from a side of the prism by reflection of the excitation light on the metal film;
• and
• a positioning step of performing positioning of the reflective member in such a manner that the position of the reflective member and the orientation of the reflective surface respectively coincide with a position of the reflective member and with an orientation of the reflective surface when a maximum amount of light is measured in the scanning step.