Lateral diode compatible with FinFET and method to fabricate same

A method to fabricate a diode device, comprising:

• providing a fin structure formed in a silicon-on-insulator (SOI) layer, the fin structure having a sacrificial gate structure disposed on and covering a portion of the fin structure between a first end of the fin structure and a second end of the fin structure;
• depositing first doped semiconductor material on the first end of the fin structure and on the second end of the fin structure not covered by the sacrificial gate structure, the first doped semiconductor material on the first end of the fin structure having one of the same doping polarity or an opposite doping polarity as the first doped semiconductor material on the second end of the fin structure;
• removing the sacrificial gate structure to form a gap between the deposited first doped semiconductor material on the first and the second ends of the fin structure;
• depositing a second doped semiconductor material within the gap;
• and
• forming a first electrical contact that is conductively connected to the first doped semiconductor material on the first end of the fin structure and a second electrical contact that is conductively connected to the first doped semiconductor material on the second end of the fin structure.