System and method for measuring a workpiece relative to a common measurement coordinate system
AssigneeUnited Technologies Corporation
InventorJames Romanelli
Life of this patent
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Abstract
A method for inspecting a surface geometry of a workpiece includes mounting the workpiece to a measurement artifact that includes a plurality of parametric datum features. The parametric datum features may be utilized by a first inspection device and a second inspection device to establish a measurement coordinate system. The surface geometry is measured relative to the measurement coordinate system with the first inspection device to provide first measurement data. The surface geometry is also measured relative to the measurement coordinate system with the second inspection device to provide second measurement data.
Claims18
A method for inspecting a surface geometry of a workpiece, comprising:
- mounting the workpiece to a measurement artifact comprising a plurality of parametric datum features that establish a measurement coordinate system;
- measuring the surface geometry relative to the measurement coordinate system with a first inspection device to provide first measurement data;
- measuring the surface geometry relative to the measurement coordinate system with a second inspection device to provide second measurement data;
- transforming the first measurement data and the second measurement data from the measurement coordinate system into a reference coordinate system to respectively provide first transformed measurement data and second transformed measurement data;
- respectively comparing the first transformed measurement data and the second transformed measurement data to workpiece reference data;
- and
- comparing the first measurement data with the workpiece reference data to provide a transform matrix, wherein the first measurement data is processed with the transform matrix to provide the first transformed measurement data.
A method for inspecting a surface geometry of a workpiece, comprising:
- mounting the workpiece to a measurement artifact comprising a plurality of parametric datum features that establish a measurement coordinate system;
- measuring the surface geometry relative to the measurement coordinate system with a first inspection device to provide first measurement data;
- measuring the surface geometry relative to the measurement coordinate system with a second inspection device to provide second measurement data;
- and
- comparing the first measurement data with the workpiece reference data to provide a transform matrix, wherein the second inspection device measures the surface geometry utilizing the transform matrix.
A measurement artifact for establishing a measurement coordinate system during inspection of a workpiece, comprising:
- a measurement artifact plate that extends vertically between a planar first end surface and a second end surface, longitudinally between a first side surface and a second side surface, and laterally between a third side surface and a fourth side surface;
- a slot that extends longitudinally through the artifact plate between the first side surface and the second side surface, the slot comprising a planar first slot surface that extends vertically from a second slot surface to the first end surface, the second slot surface extending laterally from the first slot surface to the third side surface;
- and
- a notch comprising a first notch surface that extends longitudinally from the first side surface to a second notch surface and vertically from the first end surface to a third notch surface, the second notch surface extending laterally from the fourth side surface to the first notch surface and vertically from the first end surface to the third notch surface, and the third notch surface extending longitudinally from the first side surface to the second notch surface and laterally from the fourth side surface to the first notch surface.
A measurement artifact for establishing a measurement coordinate system during inspection of a workpiece, comprising:
- a measurement artifact plate that extends vertically between a planar first end surface and a second end surface, longitudinally between a first side surface and a second side surface, and laterally between a third side surface and a fourth side surface;
- a slot that extends longitudinally through the artifact plate between the first side surface and the second side surface, the slot comprising a planar first slot surface that extends vertically from a second slot surface to the first end surface, the second slot surface extending laterally from the first slot surface to the third side surface;
- and
- a substantially spherical body located adjacent a corner between the first side surface and the fourth side surface;
- wherein the first end surface establishes a primary planar datum, the first slot surface establishes a secondary line datum, and the spherical body establishes a tertiary point datum, and the primary planar datum, the secondary line datum and the tertiary point datum establish the measurement coordinate system.
Dependencies are inferred from the claim text.