Processes for surface measurement and modification by scanning probe microscopy functioning in continuous curvilinear mode, scanning probe microscope and device permitting their implementation of said methods
AssigneesCentre National de la Recherche Scientifique (CNRS), Universite du Maine (Le Mans)
InventorsOlivier Noel, Pierre-Emmanuel Mazeran, Hussein Nasrallah
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Abstract
The invention relates to processes for the modification of surfaces and on processes for the measurement of adhesion forces and of different forces of interaction (friction forces, adhesion forces) by scanning probe microscopy functioning in continuous <<curvilinear>> mode, as well as to a scanning probe microscope and a device permitting the implementation of said processes.
Claims44
An atomic force microscopy measurement process, comprising the following steps:
- (a) to contact a surface of a sample to be analyzed with a probe for atomic force microscopy;
- (b) to put in relative continuous curvilinear movement at a given frequency said surface of the sample relative to the probe in the plane of the surface of the sample to be analyzed;
- (c) to detect for a given continuous and constant sliding velocity the lateral forces induced by the friction forces exerted between said surface of the sample to be analyzed and said tip for atomic force microscopy.
An atomic force microscopy measurement process, comprising the following steps:
- (a) to contact a surface of a sample to be analyzed with a tip of a probe for atomic force microscopy;
- (b) to put in relative continuous curvilinear movement at a given frequency said surface of the sample relative to the tip while applying simultaneously to said surface another relative movement along the Z-axis, said movement being appreciatively normal to the surface of the sample;
- (c) to detect the interactions forces exerted between said surface to be analyzed and said tip for atomic force microscopy thereby enabling one to access the adhesion forces during the withdrawal of the tip from the surface or inversely.
An atomic force microscopy measurement process, comprising the following steps:
- (a) to contact a surface of a sample to be analyzed with a tip of a probe for atomic force microscopy;
- (b) to put in relative continuous curvilinear movement at a given frequency said surface of the sample relative to the tip while applying simultaneously to said surface another relative movement along the Z-axis, said movement being appreciatively normal to the surface of the sample;
- (c) to detect for a given continuous and constant sliding velocity the friction forces as a function of the normal forces imposed during the approach-withdrawal cycles and when the tip is in contact with the surface of the sample.
An atomic force microscopy measurement process, comprising the following steps:
- (a) to contact a surface of a sample to be analyzed with a tip of a probe for atomic force microscopy;
- (b) to put in relative continuous curvilinear movement at a given frequency said surface of the sample relative to the tip while applying simultaneously to said surface another relative movement along the Z-axis, said movement being appreciatively normal to the surface of the sample;
- (c) to detect for a given continuous and constant sliding velocity the interactions forces exerted between said surface to be analyzed and said tip for atomic force microscopy thereby enabling one to access the adhesion forces during the withdrawal of the tip from the surface or inversely, and the friction forces as a function of the normal forces imposed during the approach-withdrawal cycles and when the tip is in contact with the surface of the sample.
Dependencies are inferred from the claim text.