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US 8,947,118 B2Granted
Defect detection in integrated circuit devices
AssigneeTexas Instruments Incorporated
InventorsRonald Andrew Michallick, Michael Nolan Jervis, Rex Warren Pirkle
Life of this patent
Estimating the term…
Abstract
In a method of testing integrated circuit devices, a parameter, such as initial voltage may first be measured. A low pass filter operation may be applied to the measured data to generate peer data. A particular integrated circuit device may be identified as failed or rejected when its measured parameter varies sufficiently relative to the peer data.
Claims18
A method of testing a selected integrated circuit device located within a series of integrated circuit devices, said method comprising:
- obtaining, using a tester, measured values for each of a plurality of integrated circuit devices located within said series, based on a predetermined parameter;
- calculating a peer value based on said measured values by applying a low pass filter operation to said measured values;
- obtaining a measured value for said selected integrated circuit device, based on said predetermined parameter;
- calculating a variance between said measured value for said selected integrated circuit device and said peer value;
- and
- identifying said selected integrated circuit device as defective if said variance exceeds a predetermined value.
3 more elements
A method of testing a selected integrated circuit device, said method comprising:
- obtaining measured values, using a tester, said values based on a predetermined parameter, for each of a plurality of peer integrated circuit devices, wherein said plurality of peer integrated circuit devices include at least one integrated circuit device that is proximate said selected integrated circuit device;
- calculating a peer value based on said measured values applying a low pass filter operation to said measured values;
- obtaining a measured value for said selected integrated circuit device, based on said predetermined parameter;
- calculating a variance between said measured value for said selected integrated circuit device and said peer value;
- identifying said selected integrated circuit device as defective if said variance exceeds a predetermined value.
2 more elements
Dependencies are inferred from the claim text.