Method for creating mask data, program, information processing apparatus, and method for manufacturing mask
AssigneeCanon Kabushiki Kaisha
InventorsRyo Nakayama, Tadashi Arai
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AssigneeCanon Kabushiki Kaisha
InventorsRyo Nakayama, Tadashi Arai
Estimating the term…
Data regarding a first corrected patterns on a single cell corrected such that an evaluation value of a pattern formed on a substrate after an image of a pattern of the single cell is projected onto a resist on the substrate and the resist is developed is obtained for each of a plurality of cells, a first evaluation value obtained by evaluating a projected image of the first corrected pattern on the single cell generated by the projection system is obtained for each of the cells, a second evaluation value obtained by, when the cells are arranged adjacent to one another, evaluating the projected images of the first corrected patterns on the cells is calculated, and creating a second corrected pattern by correcting the first corrected patterns on the cells arranged adjacent to one another such that the second evaluation value becomes close to the first evaluation value.
A method for creating data regarding a mask to be used by an exposure apparatus that exposes a substrate by illuminating the mask and projecting an image of pattern on the mask onto the substrate using a projection optical system, the method being executed by a computer, the method comprising the steps of:
Dependencies are inferred from the claim text.