Delay analysis processing of semiconductor integrated circuit
AssigneeNEC Corporation
InventorKoji Kanno
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AssigneeNEC Corporation
InventorKoji Kanno
Estimating the term…
A delay analysis device composed of a storage device and a data processing device analyzes a chip fabricating a semiconductor integrated circuit. Delay calculation is performed via an RC simulation with reference to a layout-implemented macro net list, macro layout data, and a cell timing library, thus producing macro delay information. An initial stage of a macro is annotated by the global clock path delay information including the edge information so as to produce a global clock delay-annotated macro net list, which is then converted into a macro delay-annotated net list. Based on the macro delay-annotated net list and timing constraint, the delay analysis device calculates delay times of signal paths and clock paths as well as clock skews with a high precision. It checks whether or not the relationship between the delay times of signal paths and clock paths meets the timing constraint, thus producing delay analysis information.
A delay analysis device for analyzing a delay property of a chip with reference to a cell timing library, said delay analysis device comprising:
A delay analysis method for analyzing a delay property of a chip with reference to a cell timing library, said delay analysis method comprising:
A non-transitory storage medium storing a delay analysis program, executable by a computer, to implement a delay analysis method for analyzing a delay property of a chip, said delay analysis method comprising:
Dependencies are inferred from the claim text.