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US 8,787,101 B2Granted
Stacked device remapping and repair
AssigneeMicron Technology, Inc.
InventorsBrent Keeth, Chris G. Martin, Troy A. Manning, Joe M. Jeddeloh, Timothy B. Cowles, Jim Rehmeyer, Paul A. LaBerge
Life of this patent
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Abstract
Various embodiments include apparatus, systems, and methods having multiple dice arranged in a stack in which a defective cell may be replaced by a spare cell on the same die or a different die. Other embodiments are described.
Claims20
An apparatus comprising:
- a plurality of dice arranged in a stack, the plurality of dice including cells;
- and
- an additional die configured to organize a memory address space into an addressable memory address space portion and a non-addressable memory address space portion, the addressable memory address space portion associated with non-defective cells among the cells, the non-addressable memory address space portion associated defective cells among the cells, wherein the addressable memory address space portion is a contiguous memory address space portion.
An apparatus comprising:
- a plurality of dice arranged in a stack, the plurality of dice including cells;
- and
- an additional die configured to organize a memory address space into an addressable memory address space portion and a non-addressable memory address space portion, the addressable memory address space portion associated with non-defective cells among the cells, the non-addressable memory address space portion associated defective cells among the cells, wherein the additional die is configured to mask at least one address of at least one defective cell among the cells from an external device.
A method comprising:
- providing a plurality of dice arranged in a stack, the plurality of dice including a plurality cells;
- providing an additional die;
- and
- organizing at the additional die a memory address space into an addressable memory address space portion and a non-addressable memory address space portion, the addressable memory address space portion associated with non-defective cells of the plurality of cells, the non-addressable memory address space portion associated defective cells of the plurality of cells, wherein the addressable memory address space portion is a contiguous addressable space portion.
1 more element
Dependencies are inferred from the claim text.