Semiconductor device and method of controlling semiconductor device
AssigneeRenesas Electronics Corporation
InventorsMotofumi Saitoh, Masayuki Terai
Life of this patent
Estimating the term…
Loading patent…
AssigneeRenesas Electronics Corporation
InventorsMotofumi Saitoh, Masayuki Terai
Estimating the term…
Provided is a semiconductor device including: a memory cell having a variable resistance device; and a control unit that controls a voltage applied to the memory cell, wherein the variable resistance device includes a lower electrode contains a first metal material, an upper electrode containing a second metal material, and an insulating film containing oxygen, the first metal material has a normalized oxide formation energy higher than that of the second metal material, and the control unit applies a positive voltage to the upper electrode at the time of an operation of increasing a resistance value of the insulating film and an operation of decreasing the resistance value thereof, and applies a positive voltage to the lower electrode at the time of an operation of reading out the resistance value of the insulating film.
A semiconductor device comprising:
A method of controlling a semiconductor device including a first electrode containing a first metal material, a second electrode containing a second metal material, and an insulating film, provided between the first electrode and the second electrode, that contains a third metal material and oxygen, the first metal material having a normalized oxide formation energy higher than that of the second metal material, the method comprising:
Dependencies are inferred from the claim text.