Apparatus and method for determining inner profiles of hollow devices
AssigneeBaker Hughes Incorporated
InventorsFrederik Goeing, Marc Aldag, Gunnar Michaelis, Harald Grimmer
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Abstract
In one aspect, an apparatus for determining an internal profile of a measured device is provided, which method in one embodiment may include: a housing having a first axis, a measuring device configured to emit a light beam along a second axis offset from the first axis; a deflection device configured to direct the emitted light beam to an inner surface of the measured device; and a driver configured to rotate the measuring device about the first axis.
Claims17
An apparatus for determining an internal profile of a member, comprising:
- a housing having a first axis central to the housing;
- a measuring device configured to emit a light beam along a second axis offset from the first axis by distance “a”;
- a deflection device located along the second axis and rotating about the second axis, the deflection device configured to direct the emitted light beam from the second axis to an inner surface of the member and to direct a light beam reflected from the inner surface of the member along the second axis to the measurement device to determine the internal profile of the member;
- and
- a driver configured to rotate the measuring device about the first axis.
A method for determining a profile of an inner surface of a measured device having a center axis, the method comprising:
- directing a light beam along a light beam axis offset from the center axis onto a deflection device located on the light beam axis and rotating about the light beam axis;
- deflecting the light beam at the rotating deflection device from the light beam axis onto the inner surface of the measured device;
- receiving light reflected from the inner surface of the measured device responsive to the light beam directed to the inner surface of the measured device;
- and
- determining the profile of the inner surface of the measured device from the reflected light received from the inner surface of the measured device.
Dependencies are inferred from the claim text.