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US 8,786,843 B2Granted
Testing of passive optical components
AssigneeVerizon Patent and Licensing Inc.
InventorDavid Zhi Chen
Life of this patent
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Abstract
Methods and devices provide for transmitting a series of optical signals within a range of an O-band through a U-band into a device under test comprising one or more passive optical components; measuring powers of the optical signals that propagated through the device under test; calculating wavelength-dependent insertion loss values based on the measured power of the optical signals; measuring powers of reflected portions of the optical signals that propagated through the device under test; and calculating wavelength-dependent return loss values based on the measured powers of the reflected portion of the optical signal.
Claims21
A method comprising:
- setting a state of polarization of an optical signal;
- setting a first initial state of polarization of the optical signal that propagates through a device under test;
- setting a second initial state of polarization of a reflected portion of the optical signal that propagates through the device under test;
- transmitting the optical signal, via a test system, into the device under test comprising one or more passive optical components;
- measuring a power of the optical signal that propagated through the device under test;
- calculating a wavelength-dependent insertion loss based on the measured power of the optical signal;
- measuring another power of the reflected portion of the optical signal that propagated through the device under test;
- and
- calculating a wavelength-dependent return loss based on the other measured power of the reflected portion of the optical signal.
6 more elements
A test system comprising:
- a user device comprising:
- a communication interface;
- one or more memories that store instructions;
- and
- one or more processors to execute the instructions to:
- receive a selection of parameters directed to conducting a test of a device under test comprising one or more passive optical components;
- cause, via the communication interface, other test components of the test system to conduct the test based on the parameters, the other test components comprising:
- an optical signal source capable of transmitting an optical signal, which has a wavelength between an O-band through a U-band, through the device under test;
- an optical receiver comprising a power meter that is optically connected to, and upstream from, the device under test;
- and
- another optical receiver comprising a power meter that is optically connected to, and downstream from, the device under test;
- collect, via the communication interface, test data during the test from the optical receiver and the other optical receiver;
- calculate, wavelength-dependent insertion loss and wavelength-dependent return loss;
- and
- store wavelength-dependent insertion loss and wavelength-dependent return loss values.
12 more elements
The test system of claim of 9, wherein the other test components further comprising:
- an optical phase mask that is optically connected to, and downstream from, the device under test;
- and
- another optical phase mask that is optically connected to, and upstream from, the device under test;
- wherein, when causing, the one or more processors further execute the instructions to:
- cause the optical phase mask to filter a mode of the optical signal;
- and
- cause the other optical phase mask to filter a mode of a reflected portion of the optical signal.
4 more elements
A method comprising:
- setting states of polarization of the optical signals;
- transmitting a series of optical signals within a range of an O-band through a U-band, via a test system, into a device under test comprising one or more passive optical components;
- rotating states of polarization of the optical signals that propagated through the device under test;
- measuring powers of the optical signals that propagated through the device under test;
- calculating wavelength-dependent insertion loss values based on the measured powers of the optical signals;
- rotating states of polarization of reflected portions of the optical signals that propagated through the device under test;
- measuring powers of the reflected portions of the optical signals that propagated through the device under test;
- calculating wavelength-dependent return loss values based on the measured powers of the reflected portion of the optical signal;
- and
- calculating wavelength-dependent polarization loss values.
7 more elements
A method comprising:
- setting a first mode to be filtered out of optical signals;
- setting a second mode to be filtered out of reflected portions of the optical signals;
- transmitting a series of the optical signals within a range of an O-band through a U-band, via a test system, into a device under test comprising one or more passive optical components;
- filtering out the first mode from the optical signals that propagated through the device under test;
- measuring powers of the optical signals that propagated through the device under test;
- calculating wavelength-dependent insertion loss values based on the measured powers of the optical signals;
- filtering out the second mode from the reflected portions of the optical signals that propagated through the device under test;
- measuring powers of the reflected portions of the optical signals that propagated through the device under test;
- calculating wavelength-dependent return loss values based on the measured powers of the reflected portion of the optical signal;
- and
- calculating wavelength-dependent multi-path interference values.
8 more elements
Dependencies are inferred from the claim text.