Luminance measurement method, luminance measurement device, and image quality adjustment technique using the method and device
AssigneeIix Inc.
InventorHiroshi Murase
Life of this patent
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AssigneeIix Inc.
InventorHiroshi Murase
Estimating the term…
Provided is a luminance measurement method for accurately measuring luminance of each pixel even if pixel images of a display panel overlap each other on an imaging surface of a camera. Pixels of a display panel are imaged by a solid-state imaging camera. One or more pixels are turned on and imaged such that pixel images do not overlap each other on an imaging surface. A central exposure factor indicating luminance of the central part of the pixel image is calculated based on a picture element output corresponding to the central part. A peripheral exposure factor indicating luminance of the peripheral part of the pixel image is calculated based on a picture element output corresponding to the peripheral part. All pixels are turned on and imaged, and luminance of all pixels is calculated based on this imaged image, the central exposure factor, and the peripheral exposure factor.
A luminance measurement method comprising:
A luminance measurement device comprising:
A correction data generation method comprising:
A correction data generation device, comprising:
A method for manufacturing an image quality adjustment type display panel comprising:
An image quality adjustment type display panel comprising:
Dependencies are inferred from the claim text.