High accuracy analog interface processing circuit

A method for processing sensor inputs of a sensor system comprising the steps of:

• receiving a sensor signal at least two signal processing interfaces;
• connecting a first of said at least two signal processing interfaces to a biasing voltage source, thereby causing said first signal processing interface to pass a sensor signal to a signal processor;
• disconnecting said first of said at least two signal processing interfaces from said biasing voltage and connecting a second of said signal processing interfaces to said biasing voltage while said sensor system is operating at a high temperature, thereby counteracting an ionic contamination of said first of said at least two signal processing interfaces;
• and alternating the steps of disconnecting said first of said first and second processing interfaces from said biasing voltage source and connecting a second of said signal processing interfaces to said biasing voltage source while said sensor system is operating at a high temperature and disconnecting said second of said at least two signal processing interfaces from said biasing voltage and connecting a first of said signal processing interfaces to said biasing voltage while said sensor system is operating at a high temperature, at a set time period, wherein said set time period is substantially less than a time period required for ionic contamination to place said sensor signals out of tolerance.

An aircraft sensor configuration comprising:

• at least one analog sensor;
• a first and second signal processing interface;
• a processing system connected to an output of each of said first and second signal processing interfaces;
• a biasing voltage source switchably coupled to said first signal processing interface via a first switch assembly and switchably coupled to said second signal processing interface via a second switch assembly;
• and
• a first control output of said processing system controllably coupled to said first switch assembly and a second control output of said processing system controllably couple to said second switch assembly;
• wherein said processing system includes a memory storing instructions operable to cause said sensor processing circuit to perform the steps of:
• connecting a first of said first and second signal processing interfaces to the biasing voltage source, thereby causing said first signal processing interface to pass a sensor signal to the processing system;
• disconnecting said first of said first and second processing interfaces from said biasing voltage source and connecting a second of said signal processing interfaces to said biasing voltage source while said sensor system is operating at a high temperature;
• disconnecting said second of said at least two signal processing interfaces from said biasing voltage and connecting a first of said signal processing interfaces to said biasing voltage while said sensor system is operating at a high temperature;
• and alternating the steps of disconnecting said first of said first and second processing interfaces from said biasing voltage source and connecting a second of said signal processing interfaces to said biasing voltage source while said sensor system is operating at a high temperature and disconnecting said second of said at least two signal processing interfaces from said biasing voltage and connecting a first of said signal processing interfaces to said biasing voltage while said sensor system is operating at a high temperature, at a set time period, wherein said set time period is substantially less than a time period required for ionic contamination to place said sensor signals out of tolerance.