Test circuit and test method for detecting electrical defect in TFT-LCD

Abstract

The present disclosure discloses a test circuit and a test method for detecting a TFT-LCD electrical defect, which relates to the field of liquid crystal display and is able to distinguish effectively between a capacitive defect and a TFT defect. The test circuit for detecting a TFT-LCD electrical defect includes: a test apparatus connected with the input terminals of a first reference voltage and a second reference voltage corresponding to the same gray scale, the test apparatus controls the output terminals of the first reference voltage and the second reference voltage to output a constant voltage to a data line. The present disclosure can be applied to a liquid crystal display.

Dependencies are inferred from the claim text.