Back to results
US 8,786,302 B2Granted
Test circuit for use in a semiconductor apparatus
AssigneeSK hynix Inc.
InventorHong-Sok Choi
Life of this patent
Estimating the term…
Abstract
A test circuit that senses a misaligned probe during a test includes a first power control section that senses voltage levels of a plurality of sensing lines and controls power supplied to a lower circuit section provided below a part of a pad group, and a second power control section that selectively provides an internal voltage in response to a sensing result of the first power control section.
Claims5
A semiconductor apparatus comprising:
- first and second pad groups, wherein each pad in the pad groups includes an edge region surrounding a region to be probed;
- a plurality of sensing lines provided below a part of the edge region of at least one of the pads in the first pad group;
- a circuit section under at least one of the pads of the first or second pad groups;
- and
- a test circuit configured to
- sense a short circuit between the at least one of the pads in the first pad group and the plurality of sensing lines thereby sensing abnormal pressure of a probe,
- control the operation of the circuit section, and
- monitor the circuit section.
5 more elements
Dependencies are inferred from the claim text.