Probe assembly and methods for use in inspecting a component

A probe assembly comprising:

• a probe body comprising a power supply;
• and
• a probe tip coupled to said probe body, said probe tip comprising:
• a plurality of light emitters;
• and
• a control circuit coupled to said plurality of light emitters, said control circuit is configured to control a projection of a plurality of light patterns from said plurality of light emitters for performing an analysis of the plurality of light patterns using images of the plurality of light patterns on a component being inspected, wherein said control circuit controls the projection of the plurality of light patterns by:
• receiving electrical energy from a drive circuit;
• identifying at least one of said plurality of light emitters for receiving a power input based at least in part on the received electrical energy;
• and
• transmitting the power input to said at least one identified light emitter, based at least in part on the received electrical energy to enable the activation of said at least one identified light emitter such that light is emitted therethrough.

A method of inspecting a component, said method comprising controlling a projection of a plurality of light patterns from a plurality of light emitters via a controller, wherein controlling the projection of the plurality of light patterns further comprises:

• receiving electrical energy from a drive circuit;
• identifying at least one of the plurality of light emitters for receiving a power input based at least in part on the received electrical energy;
• and
• transmitting the power input to the at least one identified light emitter, based at least in part on the received electrical energy, to enable the activation of the at least one identified light emitter such that light is emitted therethrough.