Semiconductor device
AssigneeNissan Motor Co., Ltd.
InventorsShigeharu Yamagami, Tetsuya Hayashi, Tatsuhiro Suzuki
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AssigneeNissan Motor Co., Ltd.
InventorsShigeharu Yamagami, Tetsuya Hayashi, Tatsuhiro Suzuki
Estimating the term…
Each insulating gate portion forms a channel in part of a first well region located between a drift region and source region. A first main electrode forms junctions with part of the drift region exposed in the major surface of the drift region to constitute unipolar diodes and is connected to the first well regions and the source regions. The plurality of insulating gate portions have linear patterns parallel to each other when viewed in the normal direction of the major surface. Between each pair of adjacent insulating gate portions, junction portions in which the first main electrode forms junctions with the drift region and the first well regions are arranged along the direction that the insulating gate portions extend. The channels are formed at least in the normal direction of the major surface.
A semiconductor device, comprising:
Dependencies are inferred from the claim text.