Measurement system and imager comprising such a system

A measurement system comprising:

• a reference resistive sensor,
• means for applying a voltage to the reference resistive sensor, such that the reference resistive sensor is traversed by a reference current,
• a reference arm comprising a reference resistance and connected to the reference resistive sensor so as to be traversed by the reference current,
• at least one measurement resistive sensor,
• and, for each measurement resistive sensor:
• means for applying a voltage to the measurement resistive sensor, such that the measurement resistive sensor is traversed by a measurement current that depends on the measurement taken by the measurement resistive sensor,
• a measurement mirror arm comprising a resistance and intended to be traversed by a current that is equal to the reference current,
• a measurement transistor with a gate and a source, said source being connected to one end of the measurement mirror arm,
• means for measuring the difference in current between the measurement current and the current traversing the measurement mirror arm,
• the measurement system further comprising being characterized in that it comprises:
• a reference mirror arm comprising a resistance,
• a reference transistor with a gate, a drain, and a source, said source being connected to one end of the reference mirror arm,
• an operational amplifier with one positive input connected to one end of the reference arm, one negative input connected to the source of the reference transistor, and one output connected to the gate of the reference transistor,
• and in that the gate of each measurement transistor is connected to the output of the operational amplifier.