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US 8,785,272 B2Granted
Process to make high-K transistor dielectrics
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsLiang-Gi Yao, Ming-Fang Wang, Shih-Chang Chen, Mong-Song Liang
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Abstract
A method of reducing impurities in a high-k dielectric layer comprising the following steps. A substrate is provided. A high-k dielectric layer having impurities is formed over the substrate. The high-k dielectric layer being formed by an MOCVD or an ALCVD process. The high-k dielectric layer is annealed to reduce the impurities within the high-k dielectric layer.
Claims18
A method of reducing impurities in a high-k dielectric layer, comprising the steps of:
- providing a substrate;
- forming a high-k dielectric layer having impurities therein;
- the high-k dielectric layer being formed by a process that introduces the impurities into the high-k dielectric layer;
- annealing the high-k dielectric layer to reduce the impurities within the high-k dielectric layer, wherein annealing the high-k dielectric layer is performed in an ambient selected from the group consisting of H2, H2/N2, O2/N2, He, and Ar to avoid additional oxidation of the high-k dielectric layer;
- and
- forming a gate layer upon the annealed high-k dielectric layer.
3 more elements
Dependencies are inferred from the claim text.