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US 8,785,217 B2Granted
Tunable radiation source
AssigneeInternational Business Machines Corporation
InventorsMichael A. Gaynes, Michael S. Gordon, Nancy C. LaBianca, Kenneth P. Rodbell
Life of this patent
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Abstract
An energy distribution of soft error-inducing radiation likely to be encountered by an electronic circuit during operation is determined. A tuned radiation source having a source energy distribution similar to the determined energy distribution is prepared. The electronic circuit is tested using the tuned radiation source.
Claims16
A method comprising:
- determining an energy distribution of soft error-inducing radiation likely to be encountered by an electronic circuit during operation;
- preparing a tuned radiation source having a source energy distribution similar to said energy distribution determined in said determining step;
- and
- testing said electronic circuit with said tuned radiation source;
- wherein said preparing step comprises interspersing a plurality of radiation sources with a plurality of absorbers.
2 more elements
A method comprising:
- determining an energy distribution of soft error-inducing radiation likely to be encountered by an electronic circuit during operation;
- preparing a tuned radiation source having a source energy distribution similar to said energy distribution determined in said determining step;
- and
- testing said electronic circuit with said tuned radiation source;
- wherein said preparing step comprises depositing on a substrate a first underfill layer doped with a first radioactive material and a second underfill layer doped with a second radioactive material different than said first radioactive material.
2 more elements
A method comprising:
- determining an energy distribution of soft error-inducing radiation likely to be encountered by an electronic circuit during operation;
- preparing a tuned radiation source having a source energy distribution similar to said energy distribution determined in said determining step;
- and
- testing said electronic circuit with said tuned radiation source;
- wherein said preparing step comprises depositing on a substrate an underfill layer doped with a first radioactive material and a second radioactive material different than said first radioactive material.
2 more elements
A method comprising:
- determining an energy distribution of soft error-inducing radiation likely to be encountered by an electronic circuit during operation;
- preparing a tuned radiation source having a source energy distribution similar to said energy distribution determined in said determining step;
- and
- testing said electronic circuit with said tuned radiation source;
- wherein said preparing step comprises applying said tuned radiation source to said electronic circuit as an underfill.
2 more elements
A method comprising:
- determining an energy distribution of soft error-inducing radiation likely to be encountered by an electronic circuit during operation;
- preparing a tuned radiation source having a source energy distribution similar to said energy distribution determined in said determining step;
- and
- testing said electronic circuit with said tuned radiation source;
- wherein said preparing step comprises preparing said tuned radiation source as an external source;
- wherein said testing step comprises bringing said external source into proximity with said electronic circuit;
- wherein said electronic circuit comprises a chip that is not mounted in a package;
- wherein said bringing said external source into proximity comprises laying said tuned radiation source on top of said chip;
- and
- wherein said testing comprises probing said chip with a probe.
7 more elements
A method comprising:
- determining a pillbox shaped energy distribution appropriate for calibrating a gas proportional detector;
- preparing a tuned radiation source having a source energy distribution similar to said energy distribution determined in said determining step;
- and
- calibrating said gas proportional detector with said tuned radiation source.
1 more element
A method comprising:
- modeling an energy distribution of soft error-inducing radiation likely to be encountered by an electronic circuit during operation;
- selecting an alpha-particle emitting isotope with an emission energy that is greater than a maximum predicted in said modeling step;
- selecting a desired activity of said alpha-particle emitting isotope;
- selecting an absorber;
- modeling alpha particle transmission through said absorber;
- checking whether a result of said step of modeling said alpha particle transmission through said absorber closely matches said energy distribution from said step of modeling said energy distribution of said soft error-inducing radiation likely to be encountered by said electronic circuit during operation;
- and
- specifying a tuned radiation source in accordance with said modeling steps if said checking is affirmative.
5 more elements
Dependencies are inferred from the claim text.