ULSI wiring and method of manufacturing the same
AssigneesWaseda University, Renesas Electronics Corporation
InventorsKazuyoshi Ueno, Tetsuya Osaka, Nao Takano
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AssigneesWaseda University, Renesas Electronics Corporation
InventorsKazuyoshi Ueno, Tetsuya Osaka, Nao Takano
Estimating the term…
A method of manufacturing ULSI wiring in which wiring layers are separately formed via a diffusion prevention layer and an insulating interlayer portion made of SiO2. The method comprises the steps of treating, with a silane compound, a SiO2 surface of the insulating interlayer portion on which the diffusion layer is to be formed, performing catalyzation with an aqueous solution containing a palladium compound, forming the diffusion prevention layer by electroless plating, and then forming the wiring layer on this diffusion prevention layer. A capping layer may be formed on the wiring layer by electroless plating. Consequently, a diffusion prevention layer having good adhesive properties can be formed through a simple wet process, and, the wiring layer can directly be formed on this diffusion prevention layer by a wet process. The capping layer can also be directly formed on the wiring layer by electroless plating.
A method of manufacturing ULSI wiring in which wiring layers are separately formed via a single diffusion prevention layer formed on a surface of a hollowed portion of an insulating interlayer made of SiO2, said method comprising the steps of:
Dependencies are inferred from the claim text.