Pattern forming method, pattern forming apparatus, and method for manufacturing semiconductor device
AssigneeKabushiki Kaisha Toshiba
InventorsKazuya Fukuhara, Masayuki Hatano
Life of this patent
Estimating the term…
Loading patent…
AssigneeKabushiki Kaisha Toshiba
InventorsKazuya Fukuhara, Masayuki Hatano
Estimating the term…
According to one embodiment, a pattern forming method using a template containing a pattern that has at least one recess section or protrusion section to transfer the shape of the pattern to a resin layer on a substrate, is provided. The method includes a process for coating the resin on the substrate, a process for making the hardness of the first portion as a portion of the resin higher than the hardness of the second portion as the portion other than the first portion, and a process in which the portion other than the pattern of the template makes contact with the first portion, in a state where a gap is maintained between the template and the resin, the shape of the pattern is transferred to the second portion, and the resin is cured. Embodiments of an apparatus for pattern forming are also provided.
A pattern forming method using a template containing a base and a pattern that has at least one of a recess or at least one protrusion forming a pattern that is transferred into a resin on a substrate resulting in a reverse image of the pattern being formed on the substrate,
A pattern forming method using a template containing a pattern comprising at least one protrusion and at least one recess forming a pattern region that is transferred into a resin on a substrate resulting in a reverse image of the pattern of the pattern region on the substrate,
A method for manufacturing a semiconductor device, the method comprising a pattern forming method using a template containing a base and a pattern that has at least one of a recess or at least one protrusion forming a pattern region that is transferred onto a resin on a substrate resulting in a reverse image of the pattern region on the substrate,
A method for manufacturing a semiconductor device, the method comprising a pattern forming method using a template containing a pattern comprising at least one protrusion or at least one depression forming a pattern region that is transferred onto a resin on a substrate resulting in a reverse image of the pattern region on the substrate,
Dependencies are inferred from the claim text.