Repair control circuit and semiconductor integrated circuit using the same
AssigneeSK hynix Inc.
InventorJung Taek You
Life of this patent
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Abstract
A repair control circuit and a semiconductor integrated circuit using the same, which can reduce test time, are provided. The semiconductor integrated circuit includes a plurality of memory blocks in which a plurality of word lines are arranged, a plurality of word line drivers driving one or more of the plurality of word lines in response to a plurality of memory block selection signals, and a repair control circuit determining whether to perform a repair through comparison of repair addresses generated in response to surplus addresses and the plurality of memory block selection signals with external addresses.
Claims19
A repair control circuit comprising:
- a selection signal generation unit configured to generate selection signals in response to surplus addresses;
- a selection unit configured to selectively output a plurality of memory block selection signals for selecting one or more of a plurality of memory blocks connected to word lines in response to the selection signals;
- and
- a repair address generation unit configured to generate repair addresses in response to the selection signals and outputs of the selection unit.
A semiconductor integrated circuit comprising:
- a plurality of memory blocks in which a plurality of word lines are arranged;
- a plurality of word line drivers driving one or more of the plurality of word lines in response to a plurality of memory block selection signals;
- and
- a repair control circuit determining whether to perform a repair via comparison of repair addresses generated in response to surplus addresses and the plurality of memory block selection signals with external addresses.
Dependencies are inferred from the claim text.