Tester having system maintenance compliance tool
AssigneeTexas Instruments Incorporated
InventorsNicholas Flores, Jr., Richard G. Baker, Dennis H. Burke, Jr.
Life of this patent
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AssigneeTexas Instruments Incorporated
InventorsNicholas Flores, Jr., Richard G. Baker, Dennis H. Burke, Jr.
Estimating the term…
A tester module for automatic test equipment (ATE) includes test instruments for testing an integrated circuit device under test (DUT). A plurality of sensors include sensors coupled to or proximate to the test instruments for detecting a plurality of different maintenance triggers associated with the test instruments. A memory stores code including operating system code for controlling the test instruments and for implementing a system maintenance compliance tool. A processor is coupled to the test instruments the sensors and the memory. The processor runs the operating system code including the system maintenance compliance tool. The system maintenance compliance tool upon receiving notification of at least a first maintenance trigger automatically blocks the ATE being used for the testing. The system maintenance compliance tool can include a listing of needed maintenance actions associated with the maintenance triggers that when completed automatically releases the ATE to allow resumption of testing.
Automatic test equipment (ATE) for testing integrated circuit (IC) devices, comprising:
A tester module for automatic test equipment (ATE) including a load board attached to a test head for mounting at least one integrated circuit device under test (DUT) via a socket on said load board, said tester module comprising:
A method of testing at least one integrated circuit device under test (DUT) using automatic test equipment (ATE) including a tester module having test instruments operable for testing said DUT, comprising:
Dependencies are inferred from the claim text.