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US 8,621,660 B2Granted
Probe shape evaluation method for a scanning probe microscope
AssigneeHitachi High-Tech Science Corporation
InventorsMasafumi Watanabe, Hiroumi Momota
Life of this patent
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Abstract
Provided is a method of evaluating a probe tip shape in a scanning probe microscope, including: measuring the probe tip shape by a probe shape test sample having a needle-like structure; determining radii of cross-sections at a plurality of distances from the apex; and calculating, based on the distances and the radii, a radius of curvature when the probe tip shape is approximated by a circle.
Claims2
A probe shape evaluation method of measuring a tip shape of a probe by a scanning probe microscope to evaluate sharpness of a tip of the probe, comprising:
- a proximity step of relatively bringing the tip of the probe provided to the scanning probe microscope one of into contact with and into close distance at a predetermined interval to a surface of an evaluation sample disposed to oppose the tip of the probe;
- a scanning step of performing predetermined scanning while keeping a constant physical quantity that acts between the tip of the probe and the surface of the evaluation sample;
- a data acquisition step of acquiring a surface shape of the evaluation sample;
- a data extraction step of extracting, from pieces of acquired data, at least two sets of data pieces each containing a predetermined height (h) on a central axis drawn from an apex of the probe and a distance (r) between the central axis and an outer edge of the measured tip shape at the predetermined height, the at least two sets of data pieces having different heights (h);
- and
- a calculation step of calculating, based on the heights (h) and the distances (r) of the at least two extracted sets of data pieces, a radius of curvature (Rtip) when the tip of the probe is approximated as a spherical shape.
3 more elements
Dependencies are inferred from the claim text.