Determining lithographic set point using optical proximity correction verification simulation
AssigneeInternational Business Machines Corporation
InventorsJames A. Bruce, Edward W. Conrad, Jacek G. Smolinski
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AssigneeInternational Business Machines Corporation
InventorsJames A. Bruce, Edward W. Conrad, Jacek G. Smolinski
Estimating the term…
The subject matter disclosed herein relates to determining a lithographic set point using simulations of optical proximity correction verification. In one embodiment, a computer-implemented method of determining a lithographic tool set point for a lithographic process is disclosed. The method may include: providing a model of a production lithographic process including simulations of printed shapes; analyzing the model of the production lithographic process to determine whether a set of structures on a production mask used in the production lithographic process to create the printed shapes will fail under a plurality of set points; determining an operating region of set points where the set of structures on the production mask does not fail; and establishing a set point location within the operating region based upon a set point selection function.
A computer-implemented method of determining a lithographic tool set point for a lithographic process, the method comprising:
A computer system comprising:
A computer program comprising program code embodied in at least one non-transitory computer readable medium, which when executed, enables a computer system to implement a method for determining a lithographic tool set point for a lithographic process, the method comprising:
Dependencies are inferred from the claim text.