Semiconductor apparatus

A semiconductor apparatus comprising:

• a scan circuit block including
• a receiving section configured to generate an output signal from one of an output signal of another circuit unit which is disposed in a first chip and an output signal of a circuit unit which is disposed in a second chip, in response to a second control signal;
• and
• an output section configured to output the output signal of the receiving section to one of still another circuit unit which is disposed in the first chip and a circuit unit which is disposed in a third chip, in response to a first control signal,
• wherein the scan circuit block is disposed in the first chip.

A semiconductor apparatus comprising:

• a first via electrically connecting a first chip and a second chip;
• a first circuit unit disposed in the first chip, configured to receive test data to generate an output signal, and connected with the first via;
• a second circuit unit disposed in the first chip;
• and wherein the first circuit unit outputs the output signal to one of the first via and the second circuit unit in response to a first control signal, and a third circuit unit receives the output signal of the first circuit unit through the first via.