System and method for managing information stored in semiconductors
Assigneee.Digital Corporation
InventorPatrick Nunally
Life of this patent
Estimating the term…
Abstract
A system and method of identifying a memory includes detecting defects in regions of the memory, comparing the detected defects with defects contained in a previously-created defect map associated with the memory and stored in another memory of a device accessing the memory, confirming the identity of the memory where a result of the comparison indicates the detected defects match defects contained in the previously-created defect map; and denying the identity of the memory where the result of the comparison indicates the detected defects do not match the defects contained in the previously-created defect map.
Claims49
A method of identifying a memory, comprising:
- detecting defects in regions of the memory;
- comparing the detected defects with defects contained in a previously-created defect map associated with the memory and stored in another memory of a device accessing the memory;
- confirming the identity of the memory where a result of the comparison indicates the detected defects match defects contained in the previously-created defect map;
- and
- denying the identity of the memory where the result of the comparison indicates the detected defects do not match the defects contained in the previously-created defect map.
A method of providing identification of a memory, comprising:
- detecting defects in regions of the memory;
- and storing the detected defects as a defect map associated with the memory in another memory of a device accessing the memory so as to uniquely identify the memory to the device, further comprising, after reconnecting the memory to the device, confirming an identity of the memory by again detecting defects in regions of the memory, comparing the again detected defects with the stored defect map, confirming the identity of the memory where a result of the comparison indicates the again detected defects match defects contained in the stored defect map, and denying the identity of the memory where the result of the comparison indicates the again detected defects do not match the defects contained in the stored defect map.
An information handling system comprising:
- a memory which stores a defect map associated with another memory connectable to the information handling system;
- and a processor which, when the another memory is connected to the information handling system, detects defects in regions of the another memory, compares the detected defects with defects contained in the stored defect map, confirms the identity of the another memory where a result of the comparison indicates the detected defects match defects contained in the stored defect map, and denies the identity of the memory where the result of the comparison indicates the detected defects do not match the defects contained in the stored defect map.
An information handling system comprising:
- a memory;
- and a processor which, when another memory is connected to the information handling system, detects defects in regions of the another memory, and stores the detected defects as a defect map associated with the another memory in the memory so as to uniquely identify the another memory to the information handling system, wherein the processor, after the information handling system reconnects to the another memory, confirms an identity of the another memory by again detecting defects in regions of the another memory, comparing the again detected defects with the stored defect map, confirming the identity of the another memory where a result of the comparison indicates the again detected defects match defects contained in the stored defect map, and denying the identity of the another memory where the result of the comparison indicates the again detected defects do not match the defects contained in the stored defect map.
Dependencies are inferred from the claim text.